Abstract
The thin films of iron oxides including magnetite (Fe3O4) and hematite (α-Fe2O3) have many important applications. Both forms of oxide can occur naturally during film growth by iron deposition under various oxidation environments; an important issue is to understand and control the process resulting in a single-phase film. We have performed the in-situ -time studies using X-ray diffraction of such film growth on sapphire (001) under pure ozone by monitoring the (00L) rod. Stable magnetite growth can be maintained at growth temperatures below 600 °C up to a certain critical film thickness, beyond which the growth becomes hematite. The results demonstrate the importance of interfacial interaction in stabilizing the magnetite phase.
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