Abstract
The structure and magnetic properties of Co Cu multilayers, grown on a float glass, in a molecular beam epitaxy (MBE) system are discussed. Structural characterization of samples was performed in-situ by means of a reflection high-energy electron diffraction (RHEED) and Auger electron spectroscopy (AES), as well as ex-situ by X-ray reflectometry. For the first time, we show successful analysis of layered structure of metallic multilayers by scanning tunneling microscopy (STM). Magnetization and in-plane magnetoresistance were measured as functions of Co and Cu sublayer thicknesses. The evidences of oscillatory coupling of magnetic sublayers with varying thicknesses of nonmagnetic spacer are presented. Co Cu multilayers also display giant magnetoresistance (GMR) effect. The influence of buffer layer roughness on GMR is clearly shown.
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