Abstract
The Sn-8Zn-3Bi and Sn-9Zn-Al Pb-free solders were used to mount passive components onto printed circuit boards (PCBs) with electroless Ni immersed Au (ENIG) finishing layers using a reflow soldering process. The component mounted boards were aged at 150 °C for 200 to 1100 hours. The interfacial reactions and microstructure of the interfaces between the solders and the pads were observed using scanning electron microscopy and energy-dispersive spectrometry (EDS). Both solder joints on the two pads had similar interfacial microstructures; i.e., a very thin γ2-AuZn3 layer was formed at the interface of the solder and Ni-P layer. The γ2-AuZn3 layer transformed to an e-AuZn8 intermetallic compounds (IMC) with a consistent thickness during aging. Zinc atoms redeposited onto the IMC layer increased with increasing aging time. After aging at 150 °C for various times, the shear strengths of the ENIG and organic solderability preservative (OSP) joints were evaluated. The shear strength of the Sn-8Zn-3Bi solder joint was better than that of the Sn-9Zn-Al solder joint. All of the solder joints deteriorated after aging; however, the degradations of the OSP solder joints were more evident than those of the ENIG solder joints.
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