Abstract
Interfacial effects in sputtered La2/3Sr1/3MnO3 thin films with different capping layers (MgO, LaAlO3, SrTiO3, NdGaO3, and Au) have been locally investigated by means of x-ray absorption spectroscopy and x-ray magnetic circular dichroism at the Mn L3,2-edge. Data were acquired by using the total electron yield detection mode thus guaranteeing maximum sensitivity to the interface. The data show that LaAlO3 capping almost does not modify the bulklike Mn valence at the interface. In case of SrTiO3 and Au, the presence of divalent Mn is detected, whereas MgO and NdGaO3 capping lead to an increase of the Mn valence oxidation state. The modification of the nominal Mn valence state leads to depressed surface magnetization.
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