Abstract
Unravelling the atomic structure and chemical species of interfacial defects is critical to understanding the origin of interfacial properties in many heterojunctions. Here, by combining advanced transmission electron microscopy, spectroscopy and first-principles calculations, we demonstrate interfacial Ti diffusion in SrVO3/SrTiO3 and LaCrO3/SrTiO3 heterointerfaces and uncover that the interfacial defects induce a significant change in electronic properties by showing an electronic transformation from the insulating state to metallic state at SrVO3/SrTiO3 heterointerfaces due to the hybridization of interfacial Ti d, O p and V d, and a metallic to insulating state transformation at LaCrO3/SrTiO3 because of Ti-Cr mixing induced charge redistribution in the interfacial layer.
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