Abstract
Microstructural and compositional analysis in many structural ceramics requires sophisticated analytical electron microscopy because of the light elements (O, N, C and B) present in the materials and the nano-scale amorphous phases at the grain boundaries. In the present study, scanning transmission electron microscopy (STEM) combined with energy-dispersive x-ray spectroscopy (EDS) and parallel-detection electron energy-loss spectroscopy (PEELS) was used to analyze the composition at interfaces in β-Si3N4 whisker reinforced oxynitride glass systems. Composition profiles were acquired by either manually stepping the probe across the interface or by sequential integration during slow-rate line-scanning with a < 2.0 nm probe in the STEM mode of a Philips EM400T/FEG microscope.Silicon nitride, which has been recognized as one of the most promising candidates for high temperature applications, is typically densified by employing various sintering aids such as yttria and alumina. Reaction of the sintering aids and the oxide surface layer on Si3N4 particles forms secondary intergranular phases that are primarily silicon metal oxynitride glasses.
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