Abstract

In the present work, formation of interfaces in the W/Be layered structures was studied using X-ray photoelectron spectroscopy. Chemical composition and significance of the interfaces depending on the thickness and ordering of beryllium and tungsten layers were investigated by means of the XPS spectra decomposition technique. The formation of tungsten beryllides WBe2 and WBe12 at the W-on-Be and Be-on-W interfaces, respectively, was revealed. The thickness of WBe2 beryllide does not depend on the thickness of a tungsten top layer, whereas WBe12 thickness increases with increasing Be top layer thickness. Additionally, oxidation of a Be layer under a thin W layer was established and possible mechanism underlying this process was proposed.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.