Interface delamination analysis of TQFP package during solder reflow

Abstract

Interface delamination during solder reflow is a critical reliability problem for the plastic IC packages. The main objective of this study is to apply modified virtual crack closure method (MVCCM) for the analysis of interface delamination between the leadframe pad and the encapsulant during a lead-free solder reflow after the level 1 moisture preconditioning. In this study, the moisture diffusion parameters and the coefficient of moisture expansion (CME) of two different epoxy molding compounds (EMC) are characterized for moisture diffusion analysis and the deformation analysis due to hygroscopic swelling. At the same time, the entire thermal and moisture history of Thin Quad Flat Pack (TQFP) package is simulated from the start of level 1 moisture preconditioning (85 °C/85%RH for 168 h) to subsequent exposure to a lead-free solder reflow process. Finally, the transient development of the stress intensity factors due to thermal stress only K t , hygrostress only K h , vapor pressure only K p and combined energy release rate G tot are computed and studied by using MVCCM. Based on the calculated stress intensity factors and energy release rates, it seems that for the EMC, the Young’s modulus, moisture diffusion coefficient, CME and adhesion strength with leadframe at high temperature appear to be the most significant variables for the MSL performance of TQFP package and this matches well with the experimental finding.