Interface analysis of InAs/GaSb superlattice grown by MBE

Abstract

We report on the structural characterization of short period type-II InAs/GaSb superlattices (SLs) adapted for mid-infrared detection. These structures, grown by molecular beam epitaxy (MBE) on n-type GaSb substrates, are made up of 10 InAs monolayers (MLs) and 10 GaSb MLs and a strain balanced condition is obtained by inserting an InSb ML at the interface between InAs and GaSb in each superlattice's period. From cross-sectional transmission electron microscopy (TEM) measurements, the interface structure is analysed in detail. Very homogeneous and smooth InAs and GaSb layers all over a 50 periods SL structure are observed and high-resolution images bring out the InSb ML inserted between InAs and GaSb. Room temperature absorbance spectroscopy measurements have been performed on strain-compensated SLs including 50, 100, 300 and 400 periods, for a total absorption zone thickness of 0.32, 0.64, 1.92 and 2.56 μm, respectively. The spectra display reproducible and well-defined features with an absorption coefficient varying between 2×10 3 and 4×10 3 cm −1 in the 3–5 μm mid-infrared domain, a sign of high-quality samples suitable for detection.