Abstract
We compared the interdiffusion of a Ta/Mg/Fe/Ta/Pd thin film system after deuterium absorption and desorption at 250°C with an annealing of the film structure to 250°C. The combined X-ray and neutron reflectometry study shows that the layers start to interdiffuse at 250°C with the film structure still clearly visible. In contrast, after deuterium absorption and desorption the changes of the film structure are more severe. We observe an intermixing of the Mg/Fe/Ta/Pd layers with only the bottom Ta layer staying intact.
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