Abstract
The interdiffusion of Al and Cr thin films from 659–726 K was investigated by measurements employing Auger electron spectroscopy (AES) and Ar ion beam sputtering. The only intermetallic phase observed at the Al–Cr interface of isothermally annealed couples was Al7Cr. The rate constant measured for the parabolic-growth model dx/dt=K/x of the Al7Cr-layer thickness was K=1.3×106 exp[−(262 kJ mol−1)/RT] cm2 s−1. The chemical interdiffusion coefficient ? was calculated from compositional profiles of unannealed and annealed specimens by the Boltzmann–Matano solution to the interdiffusion of bimetallic, semiinfinite couples that form three phases. The interdiffusion coefficient was ?=1.3×106 exp [−240 kJ mol−1)/RT] cm2 s−1 at 6 at. % Cr.
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