Abstract

Tracer diffusion experiments have historically furnished much of the information about fundamental diffusion processes as embodied in such quantities as tracer correlation factors and vacancy-atom exchange frequencies. As tracer diffusion experiments using radiotracers are rather less often performed nowadays, it is important to be able to process other diffusion data to provide similar fundamental information. New procedures that are primarily based around the random alloy model have been established recently for analyzing chemical diffusion data in binary and ternary alloy systems. These procedures are reviewed here. First, we review the random alloy model, the Sum-rule relating the phenomenological coefficients and three diffusion kinetics formalisms making use of the random alloy. Next, we show how atom-vacancy exchange frequency ratios and then component tracer correlation factors can be extracted from chemical diffusion data in alloy systems. Examples are taken from intrinsic diffusion and interdiffusion data in a number of binary and ternary alloys.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.