Abstract
Phase selective chemical vapor deposition of nanostructured vanadium dioxide (VO2) and sesquioxide (V2O3) was achieved by deploying [V(OR)4]n (R = tBu, n = 1 (1), R = Et, n = 3 (2), R = Me, n = 4 (3)). Use of [V(OtBu)4] (1) produced thin films of monoclinic VO2 (M1) at 700 and 800 °C consisting of anisotropic nanostructures with high crystallinity and small hysteresis in the metal-to-semiconductor transition (MST). Film morphologies manifested strong dependence on growth temperatures and exhibited pronounced texturing effects at high temperatures (>700 °C). The microstructure of the films was found to significantly affect the MST behavior of VO2 films. DTA measurements of VO2 films showed MST at 63 °C (700 °C) and 65 °C (800 °C), much lower than the transition temperature observed in single crystal material (68 °C). Precursors were characterized in the solid state (XRD) and solution state (temperature dependent EPR, NMR) to reveal an association–dissociation equilibrium in solution (complexes 2 and 3), in...
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