Abstract
We have performed regular spectral transmittance and reflectance measurements over the 1 (mu) m to 2.5 (mu) m wavelength region on several different types of materials using three different spectrophotometer systems. Two of the systems employ grating-based monochromators and InGaAs photovoltaic detectors. The beam at the sample position is nearly collimated. The other system uses an FTIR (Fourier Transform Infrared) spectrophometer as a source and a diffuse Au-coated integrating sphere with a photoconductive HgCdTe detector. In this system, the sample is placed at the focus of an f/6 converging beam. Measurements are performed on transmissive materials as well as either highly reflective or absorptive mirrors and the results are compared, taking into account any differences in beam geometry and polarization among the different systems.
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