Abstract
TOF-SIMS mass spectroscopy data are presented on ion irradiation of hard dental tissue using a beam of 129Xe20+ (15 kV) ions delivered in the ARIBE facility by an ECR source. The investigation was focused on the mass distribution of the fragment ions. A comparison is made between the mass spectra from hard dental tissue treated by olaflur-(C27H60F2N2O3) and untreated hard dental tissue obtained under irradiation by low-energy highly-charged ions (HCIs). We found significant differences between the mass spectra of enamel after introducing amine fluoride (olaflur) and the mass spectra of pure untreated enamel. Further, we separated out the effects caused by radiation induced in the tooth enamel from those induced in dentin, which has not been performed before. In order to conduct a further detailed analysis, it is necessary to extend the research scope to include the influence of fluorine compounds on enamel and dentin.
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