Abstract
Inelastic (Raman) light scattering by phonons interacting with anisotropic imperfections is investigated. Three different kind of disorder-induced defects (point, linear and planar) have been considered. The optical phonon width and line shape are found to depend importantly on the dimension of the imperfections. There is a close correspondence between the scale of the imperfection and the phonon line shape observed in the Raman scattering experiments. The dependence of the phonon frequency shift and width on the defect concentrations is calculated, and the critical concentrations at which the optical phonon can no longer be observed are determined.
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