Abstract
Secondary ion emission was studied using atomic and molecular ions bombarding organic and metallic targets. The energy of the projectile ions varied from 200 keV to 3 MeV. Relative yields of positive and negative secondary ions desorbed from phenylalanine and aluminum targets were identified by time-of-flight mass spectrometry. C q+ , O q+ , N q+ , CO + and CO 2 + (0 ≤ q ≤ 7) were the beams used in this study. The yield obtained for [M−H] −, [M + H] + and H − and H + secondary ions indicate the existence of two mechanisms for the desorption process: the kinetic and the surface mechanism.
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