Abstract

Time-of-flight mass spectroscopy methods are employed for studying processes occurring during capture of electrons by 3He2+ and Ar6+ multiply charged ions with energy 6z keV (z is the ion charge) from C2Hn molecules (n = 2, 4, 6) with different multiplicities of C-C bonds. Fragmentation schemes of the molecular ions formed in such processes are established from analysis of correlations of recording times for all fragment ions. The absolute values of the cross sections of capture of an electron and capture with ionization are measured, as well as the cross sections of formation of fragment ions in these processes. The absolute values of total capture cross sections for several electrons are determined.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call