Abstract
Thermal diffuse scattering (TDS) x‐ray intensity patterns from phonons in an fcc δ‐Pu‐Ga alloy have been recorded for the first time. A small‐diameter (25‐μm) monochromatic 18‐keV x‐ray beam was used to obtain good‐quality TDS images from a polycrystalline δ‐Pu‐Ga specimen. The recorded TDS images agree qualitatively well with theoretical images predicted by a generalized Morse potential for an fcc lattice with parameters determined directly from the known elastic constants of the alloy. These results illustrate the power of TDS analysis for phonon studies in otherwise inaccessible systems and are the target basis for a future determination of actual phonon dispersion curves in fcc‐Pu materials using a combination of both TDS experiments and high‐resolution inelastic x‐ray scattering (HRIXS).
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