Abstract

Line shapes of atomic lines and soft X-ray emission bands are described using pseudo-Voigt profiles accounting for the presence of non-diagram features (low and high energy satellites) and instrumental distortions. Peak shape changes of soft X-ray emission bands as a function of the excitation conditions and the matrix composition are related with self-absorption phenomena. Implications of spectral deconvolution of WDS X-ray intensity measurement for quantitative analysis of complex spectra and for studying valence states are reviewed.

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