Intensity Measurement of Equal-Thickness Fringes in TEM Images of Wedge-Shaped GaAs and InP Crystals by a Slow-Scan CCD Camera

Koji Nishio , Hiroshi Kakibayashi + Show 3 more

https://doi.org/10.1093/oxfordjournals.jmicro.a051107

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Publication Date: Aug 1, 1994

Abstract

Intensity Measurement of Equal-Thickness Fringes in TEM Images of Wedge-Shaped GaAs and InP Crystals by a Slow-Scan CCD Camera

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