Abstract
In this paper, we present a new image enhancement method for a vision-based automated defect inspection system on the surface image of a thin film transistor liquid crystal display (TFT-LCD) panel. The TFT-LCD image has nonuniform brightness, which is a major difficulty in finding defective regions. The proposed method effectively estimates the nonuniform intensity variation except in defective regions using multiweighted morphological filters. After estimation, defects can be segmented easily using difference from the original image. Experimental results verified the performance of the proposed method.
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