Abstract
An attempt is made to investigate the integrity of gas barrier SiO x film on PET (polyethylene terapthalate) by AE characterization during tensile loading. As the amplitude of AE signals is very weak due to the thinness of the SiO x film and high wave attenuation of PET, a new AE monitoring system, consisting of an AE sensor with an internal amplification of 120 dB, a broadband preamplifier, a fast A/D converter and a personal computer, was used to monitor the Lamb waves emitted by the fracture and/or exfoliation of the SiO x film. Dispersion of the group velocity obtained by the wavelet transform agreed well with the theoretical group velocity of the zeroth order symmetric Lamb mode (S o) of the PET. The S o mode Lamb wave was monitored for the specimen with SiO x films thicker than 180 nm and usef for the identification of source location. The threshold tensile strain to cause the first fracture, estimated by the developed AE monitoring, agreed well with the strain determined by a laser microscope. The estimated source amplitude of AE waves showed a fairly good relationship with the segmental crack size in the SiO x film.
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