Abstract

A novel integration technique for segmented 3D profiles measured by projected fringe profilometry is proposed. This method is able to match images successfully even in the presence of geometric deformations, illumination changes, and severe occlusions. Tests of the system performance have been carried out that accuracy of the registration scheme is one part in one hundred of one pixel. This technique is superior to the other methods because of its higher accuracy, improved robustness, and reduced computational cost.

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