Abstract

We report the first integration of the interface sensitive technique vibrational sum frequency spectroscopy (VSFS) and the mass sensitive technique quartz crystal microbalance (QCM). VSFS-QCM has been applied in-situ to follow the formation of a thin Cu2O-like oxide on octadecanethiol-covered copper in dry air at ambient pressure conditions. We observed significant changes and an evolution of the VSF spectra caused by alterations in the electronic properties of the metal surface, and simultaneous shifts in the QCM resonance frequency due to a mass change during the formation of the oxide. QCM and VSFS exhibit a resolution corresponding to the formation of around 2% and 5% of an ideal monolayer of Cu2O, respectively. The successful integration of QCM increases the versatility of VSFS in numerous applications, where simultaneous in situ mass and spectroscopic information is desirable.

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