Integration of Behavioral Models in the Full-Field TLM Method

Abstract

The accurate simulation of digital circuits requires the inclusion of field phenomena. Issues such as signal integrity, crosstalk, and external EMI are of paramount importance in the design stage, due to the decreasing feature size and increasing clock frequency of modern digital systems. This paper addresses issues with the incorporation of field phenomena in the simulation of digital systems, by embedding behavioral descriptions of digital ICs into a full wave field model. The paper successfully simulates digital circuits incorporating the external electromagnetic interference (EMI) environment of operation; further research is required to incorporate the internal EMI effects in the IC silicon. The transmission-line modeling method is used for the field model, while the input/output buffer information specification models the digital IC behavior.