Abstract
A novel integrated on-chip wavelength-based beam emitter is proposed and fabricated to realize two-dimensional optical scanning. By combining both wavelength division filters and emission array, 80 × 8 far-field optical beam spots are achieved with a field of view of 6° × 4°. Both collimation and projection modes are tested and 64 wavelength channels are realized in 10 nm bandwidth from 1550 to 1560 nm. This device can be used for LIDAR, optical wireless communication, and high-speed infrared imaging applications.
Highlights
Optical beam scanners have attracted great attention in recent years due to their potential use in a broad range of applications, like high-speed optical communication [1], [2], laser mapping [3] and laser imaging [4]
The light beams emitted from the device become collimated beams after passing through the lens, which can be used for scanning large depth of field, for example, Lidar or optical wireless communications [22], [23]
A 2D wavelength-scanning device based on silicon photonic integrated technology is proposed and demonstrated
Summary
Optical beam scanners have attracted great attention in recent years due to their potential use in a broad range of applications, like high-speed optical communication [1], [2], laser mapping [3] and laser imaging [4]. Due to its complementary metal–oxide–semiconductor (CMOS) compatibility potentially enable on-chip beam scanners with high volume and low cost [6]. Optical phased arrays (OPAs) using silicon photonics have been proposed as a promising architecture to achieve beam steering [7]–[14]. OPA is generally composed of an array of optical phase shifters and emitters. In order to achieve larger angular resolution, the number of antennas and phase shifters will be very huge. In this case, it will be very difficult to increase the space between phase shifters to avoid thermal crosstalk and high power consumption will be an issue at the same time. To reduce the complexity of tuning system, some OPAs use wavelength tuning to steer the
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