Abstract
Journal Article Integrated SIMS-AFM Instrument for Accurate High-Sensitivity and High-Resolution Chemical 3D Analysis Get access Y Fleming, Y Fleming Advanced Instrumentation for Ion Nano-Analytics (AINA), Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg Search for other works by this author on: Oxford Academic Google Scholar T Wirtz, T Wirtz Advanced Instrumentation for Ion Nano-Analytics (AINA), Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg Search for other works by this author on: Oxford Academic Google Scholar S Eswara Moorthy S Eswara Moorthy Advanced Instrumentation for Ion Nano-Analytics (AINA), Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 1437–1438, https://doi.org/10.1017/S1431927615007965 Published: 23 September 2015
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