Integrated Process-Aging Modeling Methodology for Flip Chip on Flex Interconnections With Nonconductive Adhesives

Abstract

This paper presents a comprehensive methodology to model the static temperature-humidity (TH) aging test ( 85 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">deg</sup> C/85%RH over 1000 h) of flip chip on flex interconnections with nonconductive adhesives (NCAs). NCAs, being a special form of conductive adhesives, are chosen, as they allow bringing the pitch further down. The methodology combines experimental techniques for material characterization, finite element modeling (FEM), and model validation. A NCA has been characterized using several techniques. The thermomechanical properties and the moisture absorption properties were obtained for the NCA. A temperature dependent viscoelastic constitutive model was also obtained for the NCA. The viscoelastic model was defined by the Prony series expansion. The shift factor was approximated by the Williams-Landel-Ferry (WLF) equation. Finite element modeling has been performed to analyze the flip chip interconnects on flex with the NCA under process condition and reliability aging conditions. The viscoelastic constitutive relation has been used to model the NCA in aging modeling. An integrated process-aging modeling methodology has been developed to combine the thermo-mechanical stress and hygro-mechanical stress, followed by stress relaxation analysis. To verify the finite element models, static TH aging tests (85 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">deg</sup> C/85%RH) were also performed. The contact resistance was monitored with high measuring resolution during the accelerated test. The simulation results are in good agreement with the experimental results. The approach developed in this paper can be used to provide guidelines with respect to adhesive material properties, assembly process parameters to achieve good reliability performance.