Abstract
The insulator-conductor transition in very thin metal films is investigated by acoustoelectric measurements of the relation between the charge carrier density and the sheet resistance at various substrate temperatures from room temperature down to about 90 K. Near room temperature a rather sharp mobility edge is observed but at lower temperatures, in quench-condensed films, percolation effects mask the manifestation of the Anderson transition. This difference in behaviour is attributed to the change in surface mobility of the metal islands and its effect on the microscopic structure of the film.
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