Abstract
A procedure for the instrumental neutron activation analysis of micro-ingots of alloys containing In, Sb, Au, Ga, Ni, Sn and Bi is proposed. The non-destructive analysis of the irradiated samples is performed by γ-spectrometry techniques including one-crystal scintillation detectors, dual-crystal sum-coincidence scintillation detectors and Ge(Li) semiconductor detectors. As a result, the cumbersome operations of radiochemical separation can be eliminated. The sensitivity of quantitative determinations using scintillation detectors in alloys of the above composition is 10−10 g for indium, gold, antimony and gallium and 10−6 g for nickel and tin. The use of semiconductor detectors yields sensitivities of 10−10 g for indium and gold and 10−9 g for gallium and antimony.
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