In-situ X-ray diffraction study about uniaxial deformation behavior in a copper single crystal

Abstract

The deformation behavior of pure Cu single crystal has been investigated by scanning electron microscopy (SEM) and the in-situ reflection Laue method using synchrotron radiation. The main operative slip systems were determined by the slip line measurement and in-situ X-ray diffraction. The ( 1 ̄ 11)[101] and ( 1 ̄ 11)[0 1 ̄ 1] slip systems mainly operate in the middle region of sample but the (111)[ 1 ̄ 01] and ( 1 ̄ 1 ̄ 1)[011] slip systems are activated in the corner region. The condition of a minimum glide path-length through single crystal should be taken into account as one of the factors to determine the main operative slip system.