In-situ mapping of monocrystalline regions on Mars

Abstract

Elemental quantification instruments for planetary missions provide a capability for in-situ identification of mineral phases via stoichiometry, an essential step in petrological investigations. X-ray fluorescence (XRF) has been employed for this purpose by multiple generations of Mars rovers (i.e., Pathfinder, Spirit and Opportunity, Curiosity and Perseverance). The Planetary Instrument for X-ray Lithochemistry (PIXL) aboard Perseverance rasters a micro-focused X-ray beam to generate micron-mm-sized maps illustrating variations in elemental composition and allowing mission scientists to identify rock components (i.e., sedimentary grains, veins and igneous crystals). Energy-dispersive X-ray diffraction can also be detected with PIXL and can be used as an additional constraint on component boundaries, providing PIXL with the capability to map monocrystalline regions in-situ. Here we introduce and apply a new method where each diffraction peak is partitioned independently according to its energy, using the instrument geometry to inform consistent partitioning. Applying this method to datasets acquired from the Dourbes abrasion patch in the Séítah formation of Jezero crater, Mars, reveals monocrystalline regions that were hidden using previous methods. This application of the technique allows faster and more accurate visualization of petrographic textures in future PIXL datasets, in particular those with rock components that are not easily separable using stoichiometry alone.