Abstract
Procedures for determining the amount of polymer oxidation and surface chalking occurring on composite insulators are developed using FTIR spectroscopy. Numerical indicators of surface oxidation and chalking are obtained from ratios of peak heights in the IR spectra. Results of analyses of samples from three different types of EPDM 275 kV insulators suggest that oxidation is affected by surface discharging and weathering and that the amount of surface chalking is related to leakage current.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
