Abstract
Liquid crystal display (LCD) drivers usually operate at low speed, and have a low input-count but high output-count with multilevel voltages. A novel built-in-self-test (BIST) method for LCD drivers is proposed to reduce testing costs. This BIST circuit will be placed in the sawing lanes to reduce the chip area. The chip overhead and the testing costs are reduced, while the test coverage can be maintained.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
