Abstract
In this work, we used ion beam analyses (IBA) to characterize doped ZnO crystalline nanoparticles elaborated by different methods: (i) low energy cluster beam deposition (LECBD) for ZnO:Ga, (ii) metal organic framework (MOF) for ZnO:Li and (iii) sol-gel for ZnO/SiOx core-shell system.The analyses were performed either in RBS mode using 4He++ ions of 6 MeV energy (characterization of Ga and Si) or in NRA mode using 1H+ ions of 2.5 MeV energy (characterization of Li). The experimental data allowed determining the mean concentration of dopants (Ga, Li) or shell atoms (Si) and their areal masses. These elemental information, coupled with structural (TEM, X-ray) and optical (IR spectroscopy, photoluminescence) ones, were of prime importance permitting to better understand the optical properties of doped ZnO nanocrystals.
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