Abstract
ABSTRACTThe structure and polymorphism of pentacene thin films on SiO2 substrate were investigated by grazing incidence x-ray diffractometry (GIXD). The in-plane GIXD patterns were successfully obtained from vacuum deposited ultra-thin films of a few monolayers thick. The two-dimensional lattice constants were determined for both thin-film and bulk phases from the observed GIXD patterns. Considering the obtained unit cell parameters, the mechanism of the transformation between polymorphs was discussed using the classical nucleation theory.
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