Abstract
The structural and magnetic properties of as-grown 5–50nm thin ion-beam sputter deposited transition metal–metalloid Co20Fe60B20 (CFB) films are reported in this communication. A broad peak observed at 2θ∼45° in the glancing angle X-ray diffraction pattern revealed the formation of very fine nano-sized grains embedded in majority amorphous CFB matrix. Although no magnetic field is applied during deposition, the longitudinal magneto-optic Kerr effect measurements performed at 300K in these as-grown films clearly established the presence of in-plane uniaxial magnetic anisotropy (Ku). It is argued that this observed anisotropy is strain-induced. This is supported by the observed dependence of direction of Ku on the angle between applied magnetic field and crystallographic orientation of the underlying Si(100) substrate, and increase in the coercivity with the increase of the film thickness.
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