Abstract
We demonstrate that the paraelectric to ferroelectric phase transition temperature TC distribution of KTa1-xNbxO3 (KTN) crystal can be measured with a single temperature sweep by using scanning nonlinear dielectric microscopy (SNDM) in a chamber. We achieve this using our newly developed probe, which we designed to maintain a constant contact force during the temperature sweep. The TC measurement precision (standard deviation) is estimated to be 0.05 °C, where the standard deviation is defined as [∑i = 120∑j = 14(TCi j-TCi)2/(4×20-1)]1/2, in which TCi j is the TC value at point i measured in the jth trial, and TCi is the trial average of TC at point i.
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