Abstract

Lead-free Cs3Bi2I9 single crystals have been demonstrated to be promising materials for direct X-ray detectors with remarkable performance. However, their application for 2D X-ray imaging is hindered by their time-consuming preparation and limited crystal size. In this paper, a thick Cs3Bi2I9 perovskite film fabricated via facile spray coating at a low processing temperature, which increases the area of the photoactive film, reduces the processing time, decreases the energy budget and the production cost, and enhances the production yield due to high material utilization, has great potential for commercial applications. Careful control of the processing temperature and intervals during spray coating results in a dense and thick perovskite film with well-stacked perovskite domains. The compact perovskite film enhances the charge transport capability of the Cs3Bi2I9 perovskite film and reduces the dark current density of the X-ray detector. The resultant X-ray detector, prepared through a two-step spray coating process, exhibited a sensitivity of 127.23 μC Gyair−1 cm−2 and a detection limit of 7.4 μGyair s−1. In addition, the device delivers long-term stability with a consistent photoresponse when exposed to consecutive X-ray pulse irradiation.

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