Abstract
The paper presents a method of optical inspection of manufacturing processes in the visible band. The presented model of a test bench was based on a monochrome CCD camera that allows you to conduct research in the field of digital image analysis. The wavelet transform was proposed for the detection of objects and was compared with a Fast Fourier Transform (FFT). The article presents an analysis of the results of experiments for selected objects using the proposed method, allowing the evaluation of the correctness of classification. The paper also presents an analysis of the efficiency of the compared methods. In the article, the advantages of using the proposed method in the sample manufacturing process have been discussed.
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