Abstract
The electron energy-loss spectrum contains, at higher energy losses (above 50 eV), characteristic edges due to ionization of inner atomic shells. These edges are of considerable interest to the electron microscopist because they permit the qualitative and quantitative microanalysis of nearly all chemical elements on a nanometre scale. However, additional insight into the chemical and structural properties associated with the atom being excited may be gained by examination of the fine structure of these edges.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
