Inner-shell photoionization spectroscopy on deposited metal clusters using soft x-ray synchrotron radiation: An experimental setup

Abstract

Exploration of mass-selected clusters by soft x-ray synchrotron radiation is well suited to receive element specific information on clusters in contact with a support and to systematically follow the evolution of size-dependent electronic and geometrical properties from the smallest clusters toward the bulk. Here we describe an experimental setup, which combines cluster synthesis, mass selection, soft landing, ultrahigh vacuum transfer, and photoionization experiments such as x-ray photoelectron spectroscopy, x-ray absorption, and Auger electron spectroscopy. First spectroscopic results and experimental conditions are briefly discussed for Cu(19) deposited onto the natural oxide layer of a Si-wafer surface.