Inline-Feasible Contrast Separation in Luminescence Imaging for Silicon Solar Cells

Abstract

We present an article about separating contrasts in luminescence images of silicon solar cells for industrial application, i.e., in very short measurement times significantly below one second. The well-known method “Coupled Determination of Dark Saturation Current Density and Series Resistance” by Glatthaar <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">et al.</i> is optimized to drastically decrease the required exposure time. The correction using an image under short-circuit conditions is omitted. Simulations with Quokka3, which give insight into the mechanisms of contrast separation, are performed. The operating points at which the images are acquired are adjusted allowing short data acquisition times. The optimized method decreases the necessary exposure time by more than a factor of 6 to 160 ms for a multicrystalline silicon passivated emitter and rear cell (PERC) solar cell. The quality regarding contrast separation can be maintained.