Inkjet-Printed Oxide TFTs with Solution-Processed Dual Semiconductors

Abstract

The solution process is a simple and low-cost thin film deposition method that enables a large area coating and high throughput because it can circumvent the need for photolithography and vacuum deposition. Direct patterning can be processed with screen printing, imprinting, ink-jet printing, and electrohydrodynamic-jet printing. Among them, inkjet printing is an attractive technique in device fabrication for the direct pattern writing and precise materials delivery. Recently, spin-coated double-active layer oxide TFTs, in which heterostructured channels, were reported to obtain improved electrical properties at relatively low processing temperatures. However, inkjet printing can provide a patterned active layer structure and give better properties compared to a simple spin-coated one. To achieve the optimized electrical properties of an inkjet-printed double-active layer, the ZTO TFTs with various compositions of In2O3 solutions were examined. By controlling the annealing temperature and indium content, heterostructured In2O3/ZTO TFTs with improved mobility, threshold voltage and bias stability were obtained. The best electrical properties of the inkjet-printed double-active layer ZTO TFTs were obtained with 0.01 M of In2O3: a mobility of 8.6 cm2/ V s, a threshold voltage of 2.76 V, a subthreshold slope of 0.52 V/dec, and an on-to-off current ratio of 106 . The electrical properties of the inkjet-printed double-active layer oxide TFTs were superior to those of the single-active layered TFTs.