Abstract

The two main limiting factors in the accuracy of an optomechanical position monitoring system based on laser sources and photosensors are mechanical transfer between the monitored imaging sensors to the active particle tracking elements and non-straight propagation of the reference laser lines. Laser based alignment systems of Si trackers that use their own tracking detectors as photosensors are not affected by the first factor. Improving the transmittance of Si to infrared beams certainly minimizes the second one. Simulation of the passage of a light beam through a real microstrip detector and analysis of first measurements of samples are presented in this paper.

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