Infrared Surface Analysis Using a Newly Developed Thin-Sample Preparation System

Abstract

We developed a new sampling system, the Nano Catcher, for measuring the surface chemical structure of polymers or industrial products and we evaluated the performance of the system. The system can directly pick up surface species whose depth is on the order of approximately 100 nm and can easily provide a sample for a Fourier transform infrared (FT-IR) system without the necessity of passing it over to a measurement plate. The FT-IR reflection data obtained from the Nano Catcher were compared with those obtained using the attenuated total reflection (ATR) method and sampling by hand. Chemical structural analysis of a depth region from a few tens of nanometers to a few hundred nanometers can be directly performed using this system. Such depths are beyond the scope of conventional X-ray photoelectron spectroscopy (XPS) and ATR methods. We can expect the use of the Nano Catcher system to lead to a great improvement in the detection of signals of surface species in these depth regions.