Abstract
From the measurements of residual lines of crystalline quartz in infrared region of 5–28 micron, the following results were obtained: (1) When a sample was rotated around its surface normal, alternation of reflectivity was observed between a pair of dichroismic residual lines. (2) Nf, the product of ion pair concentration and oscillator strength of the residual line was succesfully calculated utilizing the maximum reflectivity of the residual line and it was found out that the oscillator strength of the dipole-moment laid in the R plane (10\bar11) had the largest value. (3) Some slight mechanical pulse knocked onto the R plane caused incidentally the intensity change of the residual lines, and this phenomenon was interpreted as the following effect that the effective number of ion pair concentration which determined the residual line intensity had three types of distribution, and their mutual transition was easily induced. (4) The disappearance and the reappearance of the residual lines were observed in t...
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