Abstract
Isooriented polycrystalline thin layers of p-bis/trimethylsilyl/-benzene, p-bis/dimethylhydroxysilyl/benzene and poly/tetramethyl-p-silphenylene-siloxane/ were grown from the melt and have been investigated by polarized infrared spectroscopic method. Polarized spectra have been interpreted on the basis of the oriented gas approximation. According to the spectra benzene rings are not significantly involved to intermolecular forces. Only the crystal spectra of the hydrogen. bonded p-bis/dime thylhydroxysilyl/benzene sample contain correlation splittings, show anomalous band pleochroisms and frequency shifts in the function, of the polarizer state. On the bases of the conventional as well as the polarized infrared and Raman spectra of the model compounds an approximate assignment is proposed for the fundamental modes of the p-silphenylene unit.
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