Abstract
CdTe crystals have been grown by the Bridgman method with excess Cd and Te. Transmission infrared (IR) microscopy revealed inclusions in the monocrystalline CdTe matrix. Energy dispersive X-ray (EDX) analysis has been performed to determine their composition. Cd inclusions show a very specific contrast in the IR microscope. This contrast is discussed in terms of dislocations due to stress relief on account of a volume misfit between a Cd inclusion and the CdTe matrix.
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